(circuit design) (LSSD) A kind of scan design which uses
separate system and scan clocks to distinguish between normal
and test mode. Latches are used in pairs, each has a normal
data input, data output and clock for system operation. For
test operation, the two latches form a master/slave pair with
one scan input, one scan output and non-overlapping scan
clocks A and B which are held low during system operation but
cause the scan data to be latched when pulsed high during
scan.
In a single latch LSSD configuration, the second latch is used
only for scan operation. Allowing it to be use as a second
system latch reduces the silicon overhead.
