<hardware> It is common lore among hackers (and in the
electronics industry at large) that the chances of sudden
hardware failure drop off exponentially with a machine's time
since first use (that is, until the relatively distant time at
which enough mechanical wear in I/O devices and
thermal-cycling stress in components has accumulated for the
machine to start going senile). Up to half of all chip and
wire failures happen within a new system's first few weeks;
such failures are often referred to as "infant mortality"
problems (or, occasionally, as "sudden infant death
syndrome").
See bathtub curve, burn-in period.
[Jargon File]
(1995-03-20)
Nearby terms:
Industry Standard Architecture « inetd « inews « infant mortality » infeasible path » inference » inference engine
